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Универзитет у Београду
Институт за нуклеарне науке Винча

Лабораторија за атомску физику

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13. Structure and Morphology of Nanosized W-Ti /Si Thin Films
accepted for publication in J. Serb. Chem. Soc. , approximate page volume: 7 pages
S. Petrovićć, B. Adnadević, D. Perusko, N. Popović, N. Bundaleski, M. Radović, B. Gaković, Z. Rakocević

12. The Application of Laser Beam Diffraction and Scattering Methods in the Shape Measurement and Determining the Material Parameters
accepted for publication in Lasers and Engineering , approximate page volume: 10 pages
M. Srecković, Ž. Tomić, S. Ostojić, J. Ilić, N. Bundaleski , R. Sekulić, V. Mlinar

11. Surface analysis of the nanostructured W-Ti thin film deposited on silicon
accepted for publication in Appl. Surf. Sci. , approximate page volume: 10 pages
S. Petrović, N. Bundaleski , D. Perusko, M. Radović, J. Kovac, M. Mitrić, B. Gaković and Z. Rakocević

10. Electrical and optical characteristics of thin films, deposited by electron-beam vapor deposition
of Ta 2 O 5

Plasma processes and polymers Vol. 3, p. 174-178, (2006)
Zh. Todorova, N. Donkov, Z. Ristić, N. Bundaleski , S. Petrović, M. Petkov

9. Structure and surface composition of NiCr sputtered thin films
Science of Sintering 38, p. 155-160, (2006)
S. Petrovic, N. Bundaleski, M. Radović, Z. Ristić, G. Gligorić, D. Perusko, S. Zec

8. A novel procedure for elimination of the peak deviations in LEIS spectra influenced by the primary ion beam profile
Nucl. Instr. Meth. B Vol. 246, p. 463-470, (2006)
N. Bundaleski , Z. Ristić, M. Radović

7. Influence of the primary ion beam profile and the energy analyzer optics to the LEIS spectra: the analytical study
Nucl. Instr. Meth. B, Vol. 237, p. 613-622, (2005)
N. Bundaleski , Z. Ristic, M. Radović, Z. Rakocević

6. On the Convergence of Series on the Calculation of the Laser Beam Intensity Scattered By Cylinder
Balkan Phys. Lett. Vol.10, 1, p.17-24, (2002)
S. Ostojic, N. Bundaleski , M. Srecković

5. Optical properties of the 127 ° cylindrical energy analyzer used in LEIS experiments
Nucl. Instr. Meth. B 198/3-4, p. 208-219, (2002)
N. Bundaleski , Z. Rakocević, I. Terzić

4. The influence of primary beam profile on LEIS spectra
Vacuum 69(1-3), p. 295-300, (2002)
N. Bundaleski, M. Radović, Z. Rakocević

3. Surface roughness minimum: Ag thin layer deposited on a glass
J. Serb. Chem. Soc. 66(7), p. 483-490, (2001)
R. Petrović, S. Strbac, N. Bundaleski, Z. Rakocević

2. The design of reflective filters based on Al x Ga 1-x N multilayers
Semiconductor Science and Technology 16, p. 91-97, (2001)
A. B. Ðurisić, N. Bundaleski, E. Herbert Li

1. A multipurpose apparatus for studying the interaction of low energy ions with solid state surface
Review of Scientific Instruments Vol. 71, No 11, p. 4195- 4200, (2000)
I. Terzić, N. Bundaleski, Z. Rakocević, N. Oklobdžija, J. Elazar

 

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